As a PhD student, you will develop a Machine Learning framework for high-resolution optical imaging and metrology. You will use the developed methods to image complex wafer metrology targets and to improve the precision of modern methods of alignment and overlay metrology.
We are looking for an enthusiastic candidate with an MSc or equivalent degree in physics or mathematics. A background in machine learning, optics and/or computational imaging is a clear advantage. Affinity for solving mathematical problems, large-scale optimization techniques, and working as part of a team are considered important. Good verbal and written communication skills (in English) are required. You will need to meet the requirements for an MSc-degree, to ensure eligibility for a Dutch PhD examination.
The position is intended as full-time (40 hours / week, 12 months / year) appointment in the service of the Netherlands Foundation of Scientific Research Institutes (NWO-I) for the duration of four years, with a starting salary of gross € 2,441 per month and a range of employment benefits. After successful completion of the PhD research a PhD degree will be granted at Vrije Universiteit Amsterdam (VU). Several courses are offered, specially developed for PhD-students. ARCNL assists any new foreign PhD-student with housing and visa applications and compensates their transport costs and furnishing expenses.
Dr. Lyuba Amitonova
Group leader Nanoscale Imaging and Metrology
Phone: +31 (0)20-754 7100
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Applications will be evaluated on a rolling basis and as soon as an excellent match is made, the position will be filled.
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ARCNL is a new type of public-private partnership between the University of Amsterdam, the VU University Amsterdam, the NWO, and ASML.De pagina van de werkgever bekijken